Device Deployer Device Component

Device problems that occur when the device becomes worn, weakened, corroded, or broken down due to processes such as aging, permeation, and…

Testing the device for its corrosive behavior to specific environments or materials. Tests may include polarization, potentiostatic, galvanic, critical pitting/crevice temperature, and…

Device problems caused by changes in the shape or size of the device or device component due to an applied force. This…

Ensuring that data used and generated by a program is correct.

Data was lost or corrupted during the operation of reducing storage space or communication bandwidth.

Testing to detect the amount of electricity leakage from the device.